Journal ArticleOPEN ACCESS

Determination of trace of total silicon in high-purity copper by molybdosilicate spectrophotometric method after generation as silicon fluoride

Bunseki Kagaku (2002) 51(8) 653-656
DOI: 10.2116/bunsekikagaku.51.653
0Citations
Citations of this article
N/AReaders
Mendeley users who have this article in their library.

Author supplied keywords

Cite

CITATION STYLE

APA

Yamaguchi, H., Itoh, S., Igarashi, S., & Kobayashi, T. (2002). Determination of trace of total silicon in high-purity copper by molybdosilicate spectrophotometric method after generation as silicon fluoride. Bunseki Kagaku, 51(8), 653–656. https://doi.org/10.2116/bunsekikagaku.51.653

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free