System and Component Failure from Electrical Overstress and Electrostatic Discharge

Abstract

Electrical overstress (EOS) and electrostatic discharge (ESD) have been an issue in devices, circuit and systems for electronics for many decades, as early as the 1970s, and continued to be an issue to today. In this chapter, the issue of EOS and ESD will be discussed. The sources of both EOS and ESD failure history will be discussed. EOS and ESD physical models, failure mechanisms, testing methods and solutions will be shown. The chapter will close with discussion on how to provide both EOS and ESD robust devices, circuits, and systems, design practices, and procedures, as well as EOS and ESD factory control programs. EOS sources also occur from design characteristics of devices, circuits, and systems.