Effect of boron concentration on recombination at the p -Si-Al 2O3 interface

Abstract

We examine the surface passivation properties of Al2O 3 deposited on boron-doped planar âŸ̈100⟠© crystalline silicon surfaces as a function of the boron concentration. Both uniformly doped and diffused surfaces are studied, with surface boron concentrations ranging from 9.2 × 1015 to 5.2 × 10 19 cm-3. Atmospheric pressure chemical vapor deposition and thermal atomic layer deposition are used to deposit the Al2O 3 films. The surface recombination rate of each sample is determined from photoconductance measurements together with the measured dopant profiles via numerical simulation, using the latest physical models. These values are compared with calculations based on the interface properties determined from capacitance-voltage and conductance measurements. It is found that the fundamental surface recombination velocity of electrons, Sn0, which describes the chemical passivation of the interface, is independent of the surface boron concentration Ns for Ns ≤ 3 × 1019 cm-3, and in excellent agreement with values calculated from the interface state density Dit and capture coefficients cn and cp measured on undiffused boron-doped surfaces. We conclude that the physical properties of the Si-Al 2O3 interface are independent of the boron dopant concentration over this range. © 2014 AIP Publishing LLC.