Noise Measurement of Semiconductor Lasers.

Abstract

Generating mechanisms and measuring methods of the intensity noise and the frequency noise of semiconductor lasers are reviewed. Both types of noise originates from the field flucturation inherent in the spontaneous emission which works as a source of a lasing field. The noise level and its property are determined with lasing mechanism and related physics. Several topics on the noise problem are also shown presented. 1.•@ ‚Í ‚ ¶‚ß ‚É "¼ "± 'Ì ƒOE•[ ƒU •[ ‚Í,•¬ OE^ ‚Å •‚ OEø-¦ ‚Å ‚ ‚é ‚± ‚AE ‚© ‚ç,OEõ ƒt ƒ@ƒC ƒo •['Ê •M ‚â OEõ ƒf ƒBƒX ƒN‹Z •p ‚¨‚ae‚¨‚ae ‚ÑŠe Ží OEv 'ª ‹Z •p ‚Ì OEõ OE¹ ‚AE ‚µ‚Ä-˜-p ‚³‚ê ‚Ä ‚¢ ‚é•B ‚» ‚Ì •Û,ƒOE •[ƒU •[ ‚ª "-• ¶ ‚· ‚é‰ß •è ŽG ‰¹ ‚ª •á ŠQ ‚AE ‚È ‚é•ê • ‡ ‚ª '½ ‚¢ •B ‚Ü ‚½,ƒOE •[ ƒU •[OEõ ‚Ì Š± •Â •« ‚ð-˜-p ‚· ‚é•ê • ‡,OEõ ‚ÌˆÊ‚ÌˆÊ 'Š ‚ä ‚ç ‚¬ ‚ð•] ‰¿ ‚µ‚Ä ‚¨‚‚¨‚-•K-v ‚ª ‚ ‚é•B-{ •e ‚Å ‚Í"¼ "± 'Ì ƒOE •[ƒU •[ ‚Ì ‹-"x ŽG ‰¹ ‚¨‚ae‚Ñ‚¨‚ae‚Ñ Žü "g •" ŽG ‰¹ ‚É‚Â ‚¢ ‚Ä,‚» ‚Ì•] ‰¿-@ ‚¨‚ae‚¨‚ae ‚ÑŽG ‰¹ "-• ¶ ‚É ŠÖ˜A ‚· ‚éOE» •Û ‚É ‚ ‚¢ ‚ĉð •à ‚· ‚é•B 2.•@ ‹-"x ŽG ‰¹ 2.1•@ ‹-"x ŽG ‰¹ ‚Ì 'è ‹` "¼ "± 'Ì ƒOE•[ ƒU •[ ‚© ‚ç ‚Ì •o-Í OEõ ‹-"x ‚ðS(t)‚AE ‚· ‚é •BS(t)‚Í '¼-¬ "I ‚È •¬ •ªS•B ‚Ì '¼ ‚É ‚ä ‚ç ‚¬•¬ •ª ‚ð-L ‚µ‚Ä ‚¨‚肨‚è,‚± ‚Ì ‚ä ‚ç ‚¬‚ª ‹-"x ŽG ‰¹ ‚AE‚È ‚é•B ‹-"x ŽG ‰¹ ‚ÍŽŸ Ž® ‚ÌRIN('Š 'Î ŽG ‰¹ ‹-"x)‚Å •] ‰¿ ‚³ ‚ê ‚é •B (1) ‚± ‚± ‚Å ‚Í ‚ä ‚ç ‚¬'Š ŠÖ ‚Ì Šp Žü "g •" ƒÖ•¬ •ª ‚Å ‚ ‚è,ŽŸ Ž® ‚Ì ‚ae ‚¤ ‚ÉS(t)‚Ì Ž© OEÈ 'Š ŠÖ ‚Ì Žü "g •" •¬ •ª ‚AE ‚µ‚Ä 'è ‹` ‚³‚ê ‚é•B (2) ‚Ü ‚½,•o-ÍS(t)‚ð Žž ŠÔt0‚ð Šî •€ ‚É ƒt •[ ƒŠ •[ "W ŠJ ‚µ, *‹à 'ò 'å Šw•H Šw •" "d ‹C •E•î •ñ •H Šw‰È(• §920‹à 'ò Žs •¬-§-ì2-40-20)