Characterization of TiO 2 doped poly (methyl methacrylate) PMMA thin films using XRD

Abstract

In the present work PMMA thin films by using different concentration of TiO 2 as dopant were prepared. The films have been prepared by using solution cast method. The prepared films were characterized by X-ray diffraction (XRD) study. The XRD result shows that the film structure was changed from amorphous to crystalline nature by increasing the TiO 2 doping concentration. The calculated crystallinity index of the TiO 2 doped PMMA varied from 15.37% to 33.80% as the concentration is increased.