Arrhythmic Risk and Treatment after Transcatheter Atrial Septal Defect Closure

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Abstract

Atrial septal defect (ASD) represents the most common congenital heart defect identified in adulthood. Atrial and ventricular geometric remodeling due to intracardiac shunt increase the risk of arrhythmias, especially atrial fibrillation (AF). Clinical, echocardiography, electrocardiogram, and device-related predictors may be used to assess the risk of atrial arrhythmias after ASD closure. The underlying mechanisms in these patients are complex and at least in part independent of the structural remodeling secondary to hemodynamic overload. Device closure of the ASD itself and its timing impact future arrhythmia risk, as well as posing a challenge for when transseptal puncture is required. Sudden cardiac death (SCD) risk is higher than in the general population and an implantable cardioverter-defibrillator (ICD) may be indicated in selected cases.

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Deaconu, S., Deaconu, A., Marascu, G., Stanculescu, M. O., Cozma, D., Cinteza, E., & Vatasescu, R. (2024, January 1). Arrhythmic Risk and Treatment after Transcatheter Atrial Septal Defect Closure. Diagnostics. Multidisciplinary Digital Publishing Institute (MDPI). https://doi.org/10.3390/diagnostics14010033

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