Design of multiple-deferred state sampling plans for exponentiated half logistic distribution

Abstract

This paper aims to develop a multiple deferred state sampling plan for a time-truncated life test if the lifetime of the item follows exponentiated half logistic distribution. The optimal parameters of the proposed plan, such as the number of successive lots required for making the decision whether to accept or reject the current lot, sample size, the rejection and acceptance numbers are obtained using two points approach. The implementation of the proposed plan is illustrated with examples. Tables are constructed for various combinations of con-sumer's and producer's risks. Comparison is also made with existing sampling plans under exponentiated half logistic distribution. The exponentiated half logistic distribution (EHLD) is a commonly used distribution in many fields, including quality control and reliability. Due to its flexibility, the EHLD is widely used to various sampling plans. Motivated by this piece of information, for the present article develops a design of multiple deferred state sampling plans for EHLD. The optimal parameters of the sampling plan are obtained using two point approaches. Further, the results are compared with existing sampling plans and showed that the proposed sampling plan is more efficient than the existing sampling plans. The practitioners need to fit the data for the EHLD first and they can apply the proposed sampling plan for the inspection of the product. The proposed plan can be applied in any manufacturing industry for the testing of the product.