Importance-Driven Deep Learning System Testing

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Abstract

Deep Learning (DL) systems are key enablers for engineering intelligent applications. Nevertheless, using DL systems in safety- A nd security-critical applications requires to provide testing evidence for their dependable operation. We introduce DeepImportance, a systematic testing methodology accompanied by an Importance-Driven (IDC) test adequacy criterion for DL systems. Applying IDC enables to establish a layer-wise functional understanding of the importance of DL system components and use this information to assess the semantic diversity of a test set. Our empirical evaluation on several DL systems and across multiple DL datasets demonstrates the usefulness and effectiveness of DeepImportance.

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Gerasimou, S., Eniser, H. F., Sen, A., & Cakan, A. (2020). Importance-Driven Deep Learning System Testing. In Proceedings - 2020 ACM/IEEE 42nd International Conference on Software Engineering: Companion, ICSE-Companion 2020 (pp. 322–323). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1145/3377812.3390793

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