Near-Field Fano-Imaging of TE and TM Modes in Silicon Microrings

Abstract

A deep-subwavelength imaging of the optical-guided modes localized in silicon microring resonators, obtained with a polarization-sensitive Fano-imaging technique, is demonstrated. We merge together near-field scanning optical microscopy and resonant forward scattering spectroscopy, leading to near-field hyperspectral imaging without the need of embedded light emitters or evanescent light coupling into the microring. The combined analysis of the observed Fano-like spectral line shapes and of the near-field intensity spatial distributions, supported by accurate numerical calculations, gives a clear discrimination between the TE and the TM modes.