Development of large size crystal growth technology of oxide eutectic scintillator and a proto-type Talbot-Lau imaging system

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Abstract

Wafers of Tb-doped GdAlO3/α-Al2O3 eutectic were fabricated by the micro-pulling-down method using an Ir crucible with a 25 × 25 mm2 die. A prototype X-ray phase imaging detector was developed using a CMOS sensor with a fiber optic plate and the eutectic wafer. X-ray spots with an 8.24 μm period were observed using the detector. X-ray phase imaging of a nylon ball with a diameter of 4 mm was also carried out. It was observed that a phase change of approximately 2 μm occurs at the air-nylon interface. This technique of X-ray phase imaging can be realized in the absence of an absorption grating.

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Kamada, K., Yamaguchi, H., Yasui, N., Ohashi, R., Den, T., Kim, K. J., … Yoshikawa, A. (2021). Development of large size crystal growth technology of oxide eutectic scintillator and a proto-type Talbot-Lau imaging system. Japanese Journal of Applied Physics, 60(SB). https://doi.org/10.35848/1347-4065/abd708

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