High-performance arduino-based interferometric quadrature phase-shift detection system with 1 nm resolution

Abstract

A quadrature phase-shift detection system for interferometry has been conceptualized and evaluated. The main components, a microcontroller and two photodetectors, make a versatile low-cost detection system for displacement measurements or more generally phase-change measurements. The system is capable of sampling at 5 kHz with a spatial resolution of 1 nm.