Abstract
Doping, compensation and photovoltaic performance have been investigated in all-metal-organic vapour-phase deposition (MOCVD) grown CdTe/CdS solar cells that were co-doped with arsenic and chlorine. Although arsenic chemical concentration is in the range of 1017-1.5×1019 cm-3, the maximum net acceptor concentration is only in the order of 1014 cm-3, as determined by capacitance-voltage characteristics. Admittance spectroscopy revealed shallow traps at 0.055 eV which were attributed to AsTe; its compensation by Cdi is discussed. Formation of the alloy CdSxTe1-x is linked to deep levels at EV+∼0.55 eV and EV+∼0.65 eV. Limits to the diffusion of photo-generated carriers were considered to be important in determining photovoltaic performance rather than carrier lifetime. Prospects for optimizing the performance of such co-doped MOCVD-grown devices are discussed. © 2009 Elsevier B.V. All rights reserved.
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Proskuryakov, Y. Y., Durose, K., Major, J. D., Al Turkestani, M. K., Barrioz, V., Irvine, S. J. C., & Jones, E. W. (2009). Doping levels, trap density of states and the performance of co-doped CdTe(As,Cl) photovoltaic devices. Solar Energy Materials and Solar Cells, 93(9), 1572–1581. https://doi.org/10.1016/j.solmat.2009.04.010
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