Abstract
A systematic series of micromagnetic simulations on periodic cross-tie/vortex wall structures in an ideal soft film at various widths, thicknesses, and period lengths is performed. For each width and thickness a natural period length is found which has minimal energy density for walls of this type. For each width, a critical thickness is determined below which the natural period length is infinite; for films thinner than this, the pure Néel wall has lower energy than any cross-tie/vortex wall. Details of the origin of the energy reduction in cross-tie/vortex walls as compared to Néel walls are also examined, and canting inside cross-tie and vortex structures in films thicker than 1 ex is explained. Copyright © 2012 Michael J. Donahue.
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CITATION STYLE
Donahue, M. J. (2012). Micromagnetic investigation of periodic cross-tie/vortex wall geometry. Advances in Condensed Matter Physics, 2012. https://doi.org/10.1155/2012/908692
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