Reconstruction the illumination pattern of the optical microscope to improve image fidelity obtained with the CR-39 detector

Abstract

In this study, the usual light source (Tungsten) used in the optical microscopy with intensity (924W/mm2) was changed to another light source (LED) of intensity 1049W/mm2). Eight pieces of the CR-39 (SSND) track detector with dimensions (1cm×1cm) and thickness (500μm) were irradiated with the Am-241 source, has radioactivity 12μci, for different irradiation times (30:30:270 sec) and direct contact with track detectors. After etched and drying the track detectors, they were read under the optical microscope (Pro-Way) before and after the source of light changed. The number of tracks in using the intensity of the Fluorescence and LED cases of lighting through the optical microscope was calculated using software via digital camera (HDEC-50B) through the calculator screen. The results showed an increase in the visibility of the track boundary with a significantly higher number of visible tracks.