Organic Polymer Solar Cell Morphology Characterization with AFM, TEM and Helium Ion Microscopy (HIM)

E van Veldhoven; H van der Veer; D Maas; P Graat; MA Verheijen; Y Galagan; R Andriessen

Journal ArticleOPEN ACCESS

Organic Polymer Solar Cell Morphology Characterization with AFM, TEM and Helium Ion Microscopy (HIM)

van Veldhoven E
van der Veer H
Maas D
et al.

Microscopy and Microanalysis (2010) 16(S2) 1380-1381

DOI: 10.1017/s1431927610059751

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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APA

van Veldhoven, E., van der Veer, H., Maas, D., Graat, P., Verheijen, M., Galagan, Y., & Andriessen, R. (2010). Organic Polymer Solar Cell Morphology Characterization with AFM, TEM and Helium Ion Microscopy (HIM). Microscopy and Microanalysis, 16(S2), 1380–1381. https://doi.org/10.1017/s1431927610059751

Organic Polymer Solar Cell Morphology Characterization with AFM, TEM and Helium Ion Microscopy (HIM)

Abstract

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