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Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconstruction Models

  • Conesa-Boj S
  • Estrade S
  • M. J
  • et al.
InTech, (2010)
DOI: 10.5772/39511
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Abstract

Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconstruction Models.

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Conesa-Boj, S., Estrade, S., M., J., D., J., Cirera, A., R., J., … Arbiol, J. (2010). Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconstruction Models. In Nanowires. InTech. https://doi.org/10.5772/39511

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