Electrostatic properties of two-dimensional WSe2 nanostructures

Abstract

Recently, two-dimensional transition metal dichalcogenides have intrigued much attention due to their promising applications in optoelectronics. The electrostatic property investigation of WSe2 nanostructures is essential for device application. Here, the interlayer screening effects of WSe2 nanoplates with different thicknesses were investigated by measuring surface potential employing Kelvin probe force microscopy. Simultaneously, charges can be injected into WSe2 nanoplate by means of conducting atomic force microscopy to tune the electrostatic properties of WSe2 nanostructures. Our experimental results have some important implications for improving performance of WSe2-based optoelectronic devices through interface or surface engineering.