In situ intercalation dynamics in inorganic-organic layered perovskite thin films

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Abstract

The properties of layered inorganic semiconductors can be manipulated by the insertion of foreign molecular species via a process known as intercalation. In the present study, we investigate the phenomenon of organic moiety (R-NH3I) intercalation in layered metal-halide (PbI 2)-based inorganic semiconductors, leading to the formation of inorganic-organic (IO) perovskites [(R-NH3)2PbI 4]. During this intercalation strong resonant exciton optical transitions are created, enabling study of the dynamics of this process. Simultaneous in situ photoluminescence (PL) and transmission measurements are used to track the structural and exciton evolution. On the basis of the experimental observations, a model is proposed which explains the process of IO perovskite formation during intercalation of the organic moiety through the inorganic semiconductor layers. The interplay between precursor film thickness and organic solution concentration/solvent highlights the role of van der Waals interactions between the layers, as well as the need for maintaining stoichiometry during intercalation. Nucleation and growth occurring during intercalation matches a Johnson-Mehl-Avrami-Kolmogorov model, with results fitting both ideal and nonideal cases. © 2014 American Chemical Society.

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Ahmad, S., Kanaujia, P. K., Niu, W., Baumberg, J. J., & Vijaya Prakash, G. (2014). In situ intercalation dynamics in inorganic-organic layered perovskite thin films. ACS Applied Materials and Interfaces, 6(13), 10238–10247. https://doi.org/10.1021/am501568j

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