High-value MOS capacitor arrays in ultradeep trenches in silicon

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Abstract

A fully Si-compatible process has been developed to manufacture 6-inch silicon (100) wafers with patterns of trenches, several hundreds of μm deep with a pitch of a few μm. The hundred-fold enlarged silicon surface is used as a substrate for MOS (Metal-Oxide-Semiconductor) capacitor arrays with a capacitance of 1 nF to 1 μF. The specific capacitance was as high as 100 nF/mm2.

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Roozeboom, F., Elfrink, R., Verhoeven, J., Van den Meerakker, J., & Holthuysen, F. (2000). High-value MOS capacitor arrays in ultradeep trenches in silicon. Microelectronic Engineering, 53(1), 581–584. https://doi.org/10.1016/S0167-9317(00)00383-X

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