Abstract
Herein, the effectiveness of post-deposition catalytic-doping (cat-doping) on various doped silicon alloys, i.e., microcrystalline silicon (μc-Si:H), nanocrystalline silicon oxide (nc-SiOx:H), and microcrystalline silicon carbide (μc-SiC:H), for the use in silicon heterojunction solar cells is investigated. Phosphorous (P) profiles by secondary ion mass spectrometry (SIMS) reveal the P distribution and its difference in these three silicon alloy films. Conductivity and effective charge carrier lifetime of different samples are found to increase to different extents after cat-doping process. Coexistence of thermal annealing, hydrogenation, and phosphorus doping is confirmed by using different gases during the cat-doping process.
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Liu, Y., Pomaska, M., Duan, W., Kim, D. Y., Köhler, M., Breuer, U., & Ding, K. (2020). Phosphorous Catalytic-Doping of Silicon Alloys for the Use in Silicon Heterojunction Solar Cells. Advanced Engineering Materials, 22(6). https://doi.org/10.1002/adem.201900613
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