Flat lens–based subwavelength focusing and scanning enabled by Fourier translation

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Abstract

We demonstrate a technique for flexibly controlling subwavelength focusing and scanning, by using the Fourier translation property of a topology-preserved flat lens. The Fourier transform property of the flat lens enables converting an initial phase shift of light into a spatial displacement of its focus. The flat lens used in the technique exhibits a numerical aperture of 0.7, leading to focusing the incident light to a subwavelength scale. Based on the technique, we realize flexible control of the focal positions with arbitrary incident light, including higher-order structured light. Particularly, the presented platform can generate multifocal spots carrying optical angular momentum, with each focal spot independently controlled by the incident phase shift. This technique results in a scanning area of 10 μm × 10 μm, allowing to realize optical scanning imaging with spatial resolution up to 700 nm. This idea is able to achieve even smaller spatial resolution when using higher-numerical-aperture flat lens and can be extended to integrated scenarios with smaller dimension. The presented technique benefits potential applications such as in scanning imaging, optical manipulation, and laser lithography.

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Zhang, X., Hu, Y., Lin, H., Yin, H., Li, Z., Fu, S., & Chen, Z. (2024). Flat lens–based subwavelength focusing and scanning enabled by Fourier translation. Nanophotonics, 13(20), 3867–3876. https://doi.org/10.1515/nanoph-2024-0206

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