Polarized neutron reflectivity study of NiFe2O4 films with very large saturation magnetization

Abstract

Epitaxial (001)-oriented NiFe2O4 films have been grown by RF magnetron sputtering on (001)MgAl2O4 substrates. In agreement with previous reports, magnetization loops of the thinner films reveal a saturation magnetization up to 3 times larger than the thicker films, which display values in agreement with the bulk. Here we discuss polarized neutron reflectivity experiments which are able to disregard that the magnetization overshoot is caused at the early stages of the growth.