Modification and Enhancement of The Structural, Morphological and Optical Characteristics of PMMA/In2O3/SiO2 Promising Ternary Nanostructures for Optical Nanodevices and Gamma Ray Attenuation

Abstract

This study explores the development of poly(methyl methacrylate) (PMMA) composites embedded with varying concentrations (0, 1, 3, and 5 wt.%) of Indium Oxide (In2O3) and Silicon Dioxide (SiO2) through the solution casting technique. X-ray diffraction (XRD) examination established the amorphous nature of pristine PMMA, which evolved into a polycrystalline structure as the additive concentration increased to 5 wt.%. Structural characteristics were further investigated using Fourier Transform Infrared Spectroscopy (FTIR), revealing physical interactions between the polymer matrix and the incorporated nanoparticles. Field Emission Scanning Electron Microscopy (FESEM) demonstrated uniform dispersion of In2O3/SiO2 within the PMMA framework. Optical studies indicated that higher nanoparticle loadings enhanced absorbance, the absorption coefficient, refractive index, extinction coefficient, and both real and imaginary components of the dielectric constant, whereas transmittance and the indirect energy bandgap decreased. The absorption coefficient remained below 104 cm-1, confirmatory an indirect electronic transition. Additionally, the gamma-ray attenuation coefficients increased as nanoparticle content rose, suggesting that the (PMMA/In2O3/SiO2) nanocomposites exhibit notable radiation shielding capabilities. These remarkable findings introduced promising materials for optoelectronic and ray attenuation applications. Polymers’ transparency, flexibility, and simplicity of fabrication render them ideal for optical nanodevices. Nevertheless, they exhibit inadequate gamma-ray attenuation in comparison to other materials (glass, metal oxides, lead-based materials), which are more effective for gamma-ray shielding. These latter materials are heavier, less malleable, and may be associated with toxicity.