Abstract
Recently, various X-ray diffraction methods have been established for surface analysis. For example, the parallel beam method enables us to make qualitative analysis of several nanometers depth of the surface. Brief introduction about some X-ray diffraction methods for surfacelayers will be described. © 1993, Japan Society of Corrosion Engineering. All rights reserved.
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APA
Iwai, T. (1993). X-ray Analysis. Zairyo to Kankyo/ Corrosion Engineering, 42(4), 236–244. https://doi.org/10.3323/jcorr1991.42.236
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