Abstract
This paper deals with the development of a parametric model based method to locate and characterize accurately important curved features such as ellipses and B-splines based curves. The method uses all the grey level information of the pixels contained within a window around the feature of interest and produces a complete parametric model that best approximates in a mean-square sense the observed grey level image intensities within the working area. Promising experimental results have been obtained on real data.
Cite
CITATION STYLE
Blaszka, T., & Deriche, R. (1995). A model based method for characterization and location of curved image features. In Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (Vol. 974, pp. 76–82). Springer Verlag. https://doi.org/10.1007/3-540-60298-4_239
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