Improved amorphous/crystalline silicon interface passivation by hydrogen plasma treatment

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Abstract

Silicon heterojunction solar cells have high open-circuit voltages thanks to excellent passivation of the wafer surfaces by thin intrinsic amorphous silicon (a-Si:H) layers deposited by plasma-enhanced chemical vapor deposition. We show a dramatic improvement in passivation when H2 plasma treatments are used during film deposition. Although the bulk of the a-Si:H layers is slightly more disordered after H2 treatment, the hydrogenation of the wafer/film interface is nevertheless improved with as-deposited layers. Employing H2 treatments, 4 cm2 heterojunction solar cells were produced with industry-compatible processes, yielding open-circuit voltages up to 725 mV and aperture area efficiencies up to 21. © 2011 American Institute of Physics.

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Descoeudres, A., Barraud, L., De Wolf, S., Strahm, B., Lachenal, D., Guérin, C., … Ballif, C. (2011). Improved amorphous/crystalline silicon interface passivation by hydrogen plasma treatment. Applied Physics Letters, 99(12). https://doi.org/10.1063/1.3641899

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