Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity

Abstract

The analysis of complex magnetic profiles throughout an ultrathin magnetic films by soft X-ray resonant magnetic reflectivity is discussed. Subnanometer resolution can be achieved allowing the separation of interface and inner layer magnetic contributions as well as the determination of antiferromagnetic and non-collinear spin structures. Reflectivity measurements are carried out up to large scattering angles allowing the determination of the depth-resolved profiles of the out-of-plane magnetic component. © 2012 EDP Sciences, Springer-Verlag.