High-resolution crack localization approach based on diffraction wave

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Abstract

The delay-and-sum imaging algorithm is a promising crack localization approach for crack detection and monitoring of key structural regions. Most studies successfully offer a hole-like damage position. However, cracks are more common than hole-like damages in a structure. To solve this issue, this paper presents a crack localization approach, based on diffraction wave theory, which is capable of imaging crack endpoints. The guided wave propagated to the crack endpoints and transformed into a diffraction wave. A line sensor array was used to record the diffraction waveform. Then, dispersion compensation was applied to shorten the dispersive wave packets and separate the overlapping wave packets. Subsequently, half-wave compensation was executed to improve the localization accuracy. Finally, the effectiveness of this high-resolution crack localization method was validated by an experimental example.

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Mu, W., Sun, J., Liu, G., & Wang, S. (2019). High-resolution crack localization approach based on diffraction wave. Sensors (Switzerland), 19(8). https://doi.org/10.3390/s19081951

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