RF pulse signal integrity analysis for nonlinear ended microstrip line atom-probe tomography

Abstract

A signal integrity (SI) analysis of high voltage rectangular short pulses for the atom- probe system is explored in this paper. The operated RF transient pulse is considered for exciting on material sample inside an ultra-high vacuum (UHV) cryogenic chamber. The ns- duration pulse signal is injected into the cryogenic analysis chamber through the transmitting system mainly constituted by a microstrip interconnect line ended by optical controlled nonlinear load. The whole system frequency characterization is performed based on the S- parameter measurements. As expected, a challenging ultra-short rectangular shape pulse is exhibited by the pulser. Promising experimental results with the improvement of ion mass spectrum is demonstrated with the designed RF pulser.