Static Probability Analysis Guided RTL Hardware Trojan Test Generation

4Citations
Citations of this article
5Readers
Mendeley users who have this article in their library.

Abstract

Directed test generation is an effective method to detect potential hardware Trojan (HT) in RTL. While the existing works are able to activate hard-to-cover Trojans by covering security targets, the effectiveness and efficiency of identifying the targets to cover are ignored. We propose a static probability analysis method for identifying the hard-to-active data channel targets and generating the corresponding assertions for the HT test generation. Our method could generate test vectors to trigger Trojans from Trusthub, DeTrust, and OpenCores in 1 minute and get 104.33X time improvement on average compared with the existing method.

Cite

CITATION STYLE

APA

Wang, H., Zhou, Q., & Cai, Y. (2023). Static Probability Analysis Guided RTL Hardware Trojan Test Generation. In Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC (pp. 510–515). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1145/3566097.3567921

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free