We have fabricated a field effect transistor (FET) based on an organic ferroelectric insulator and molecular conductor, and investigated the electrical properties and memory effects on the PEN-FET. We have observed a drastic change in the drain current at around the coercive electric field Ec of the organic ferroelectric insulator in not only a FET (PEN-FET) based on a pentacene (PEN) film but also a FET (IPEN-FET) based on an iodine doped PEN film. The magnitude of the change of the drain current for the IPEN-FET is 200 times larger than that for the PEN-FET. It is expected from these results that the PEN-FET (especially the IPEN-FET) is an improvement in such devices, since it operates at a low gate electric field accompanied by the appearance of the spontaneous polarization in the organic ferroelectric insulator. In addition, we have found that the drain current for the PEN-FET does not return to the initial drain current of EG = 0 V/cm for more than one week, even if the gate electric field is changed to 0 V/cm from 500 V/cm(> Ec). From these results, it is suggested that the PEN-FET becomes a memory device. © Central European Science Journals. All rights reserved.
CITATION STYLE
Matsuo, Y., Ijichi, T., Yamada, H., Hatori, J., & Ikehata, S. (2004). Electrical properties and memory effect in the field effect transistor based on organic ferroelectric insulator and pentacene. Central European Journal of Physics, 2(2), 117–126. https://doi.org/10.2478/bf02475636
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