Scattering from a frequency selective surface supported by a bianisotropic substrate

Abstract

In this paper a method for the analysis of a frequency selective surface (FSS) supported by a bianisotropic substrate is presented. The frequency selective structure is a thin metallic pattern - the actual FSS - on a plane supporting substrate. Integral representations of the fields in combination with the method of moments carried out in the spatial Fourier domain are shown to be a fruitful way of analyzing the problem with a complex substrate. This approach results in a very general formulation in which the supporting substrate can have arbitrary bianisotropic properties. The bianisotropic slab can be homogeneous, stratified or it can have continuously varying material parameter as a function of depth. The analysis presented in this paper is illustrated in a series of numerical examples. Results for isotropic, anisotropic and bianisotropic substrates are given.