Abstract
GaAsBi light emitting diodes containing ~6% Bi are grown on GaAs substrates. Good room-temperature electroluminescence spectra are obtained at current densities as low as 8 Acm-2. Measurements of the integrated emitted luminescence suggest that there is a continuum of localised Bi states extending up to 75 meV into the bandgap, which is in good agreement with previous photoluminescence studies. X-ray diffraction analysis shows that strain relaxation has probably occurred in the thicker samples grown in this study.
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CITATION STYLE
Richards, R. D., Hunter, C. J., Bastiman, F., Mohmad, A. R., & David, J. P. R. (2016). Telecommunication wavelength GaAsBi light emitting diodes. IET Optoelectronics, 10(2), 34–38. https://doi.org/10.1049/iet-opt.2015.0051
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