Raman study of resonance effects in Ga1-XAlxN solid solutions

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Abstract

The photoluminescence and Raman spectra of several Ga1-xAl xN layers (0 ≤ x ≤ 0.86) grown on sapphire substrates by metal-organic vapor phase epitaxy have been recorded at room temperature, under an excitation at 244 nm. Using the photoluminescence spectra, the variation of the band gap of these alloys can be followed only up to x = 0.5. From resonant Raman scattering, it can be deduced that the band gap energy of the solid solution for x very close to 0.7 corresponds to the incident photon energy (5.08 eV). This result is confirmed by a detailed comparison of the present work with previous experimental data on the A1(LO) phonon peak position, obtained under visible excitation.

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Demangeot, F., Frandon, J., Renucci, M. A., Sands, H., Batchelder, D., Ruffenach-Clur, S., … Gil, B. (1998). Raman study of resonance effects in Ga1-XAlxN solid solutions. MRS Internet Journal of Nitride Semiconductor Research, 3. https://doi.org/10.1557/S1092578300001241

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