Abstract
Radiation damage of α-Al2O3 was systematically investigated as a function of incident ion mass and energy partitioning into atomic and electronic processes by measuring the resulting stress in the ion-bombarded layer with a cantilever beam technique. Heavy-ion-bombardment- induced expansion in the implanted surface layer shows strong anisotropy which appears to be related to the higher defect production rate along the c axis. Stress relief is observed at fluences above 1×1015 Ar/cm 2 for the [0001] orientation only and is attributed to basal slip. Hydrogen bombardment subsequent to heavy-ion bombardment results in compaction which is also anisotropic. The anisotropy of both the expansion and the compaction point to structure sensitive defects. Approximately 80% of the radiation damage is annealed at 900 °C for the [0001] orientation and 60% for the [011̄0] orientation. A similar expansion-compaction response is found in argon- and hydrogen-bombarded polycrystalline Al2O 3.
Cite
CITATION STYLE
Krefft, G. B., & Eernisse, E. P. (1978). Volume expansion and annealing compaction of ion-bombarded single-crystal and polycrystalline α-Al2O3. Journal of Applied Physics, 49(5), 2725–2730. https://doi.org/10.1063/1.325194
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