The "fill-factor bias measurement" for advanced triple-junction solar cell characterization and quality control

Abstract

The "fill-factor bias measurement" method consists of measuring current-voltage curves while illuminating the cell with systematically varied light intensities of controlled wavelengths. Light within the spectral response of the subcell-under-test is typically swept from 0.1x to 10x a nominal intensity. Simultaneously, the intensity of light within the spectral responses of the remaining subcells is held constant to result in ideal current matching at the nominal intensity point. Monitoring of the FF and related characteristics as they change throughout this light-biasing sweep provides a means of evaluating individual subcells of the multi-junction device. © 2012 American Institute of Physics.