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High-Speed, Hardware-Synchronized STEM EELS Spectrum-Imaging Using a Next Generation Post-Column Imaging Filter

  • Thomas P
  • Trevor C
  • Strohbehn E
  • et al.
Microscopy and Microanalysis (2010) 16(S2) 126-127
DOI: 10.1017/s1431927610058551
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Thomas, P., Trevor, C., Strohbehn, E., Wilbrink, J., Twesten, R., & Gubbens, A. (2010). High-Speed, Hardware-Synchronized STEM EELS Spectrum-Imaging Using a Next Generation Post-Column Imaging Filter. Microscopy and Microanalysis, 16(S2), 126–127. https://doi.org/10.1017/s1431927610058551

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