Structure and modelling of four-layer screenreturned PCB Rogowski coil with very few turns for high-bandwidth SiC current measurement

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Abstract

Accurate measurement of current through a silicon carbide (SiC) device is especially challenging, because of its fast switching speed. Its accompanied current sensor must hence have a high-bandwidth and a high-noise immunity. It must also not interfere with operation of the device. Due to these, the printed-circuit-board (PCB) Rogowski current sensor is particularly suitable, but normally requires many layers. With only four layers, the existing Rogowski coils are not yet capable of shielding ambient voltage and magnetic noises simultaneously. Moreover, their computed and measured self-inductances are usually very different with errors as high as 45% reported in the literature. To resolve these issues, an alternative four-layer screen-returned PCB coil has been presented. The described coil uses very few turns to preserve its high bandwidth at the expense of even tougher determination of its self-inductance. An alternative piecewise modelling method has therefore been proposed for finding its self-inductance, needed for designing its theoretical bandwidth. These, together with a non-inverting integrator, permit current through an SiC device to be measured accurately, as demonstrated experimentally.

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Ming, L., Xin, Z., Liu, W., & Loh, P. C. (2020). Structure and modelling of four-layer screenreturned PCB Rogowski coil with very few turns for high-bandwidth SiC current measurement. IET Power Electronics, 13(4), 765–775. https://doi.org/10.1049/iet-pel.2019.0694

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