Atomic-scale imaging and spectroscopy via scanning probe microscopy: An overview

Abstract

Atomic-scale characteristics of surfaces, including their structure, chemical reactivity, and electronic properties, determine their roles in multiple fields of science and technology, e.g., as coatings, catalysts, and device components. As such, it is of utmost importance to study the atomic arrangement and atomic-scale physico-chemical properties of surfaces in real space in a robust and reliable manner. A powerful technique for achieving this goal is scanning probe microscopy (SPM). Here, we present an overview of SPM-based techniques for atomic-resolution surface imaging and spectroscopy and highlight selected advances in the field. We also discuss current challenges of SPM-based techniques for atomic-resolution surface studies.