Scanning electron microscopy of invasion process by fusarium moniliforme on soybean seed

Abstract

Fusarium moniliforme J. Sheld was observed as important seed-borne pathogen of soybean (Glycine max) having a great potentiality to cause seed-borne infection after establishing a rapid pathogenesis. The infection process was studied with scanning electron microscopy (SEM). Infection hyphae grew directly from the side or near the end of the conidium and entered the seed coat through cuticular cell juncture with or without forming appressorium. After invasion of the fungus, rapid degradation of cell wall occurred followed by intercellular and intracellular development of the fungus. Finally, tissues of the seed lost their integrity and identity and seemed as rotten mass covering with dense mycelium.