Direct measurement on the geometric phase of a double quantum dot qubit via quantum point contact device

Abstract

We propose a direct measurement scheme to read out the geometric phase of a coupled double quantum dot system via a quantum point contact(QPC) device. An effective expression of the geometric phase has been derived, which relates the geometric phase of the double quantum dot qubit to the current through QPC device. All the parameters in our expression are measurable or tunable in experiment. Moreover, since the measurement process affects the state of the qubit slightly, the geometric phase can be protected. The feasibility of the scheme has been analyzed. Further, as an example, we simulate the geometrical phase of a qubit when the QPC device is replaced by a single electron transistor(SET).