Abstract
Chip-scale devices harnessing the interaction between hot atomic ensembles and light are pushing the boundaries of precision measurement techniques into unprecedented territory. These advancements enable the realization of super-sensitive, miniaturized sensing instruments for measuring various physical parameters. The evolution of this field is propelled by a suite of sophisticated components, including miniaturized single-mode lasers, microfabricated alkali atom vapor cells, compact coil systems, scaled-down heating systems, and the application of cutting-edge micro-electro-mechanical system (MEMS) technologies. This review delves into the essential technologies needed to develop chip-scale hot atomic devices for quantum metrology, providing a comparative analysis of each technology’s features. Concluding with a forward-looking perspective, this review discusses the future potential of chip-scale hot atomic devices and the critical technologies that will drive their advancement.
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CITATION STYLE
Yu, H., Zhang, X., Zhang, J., Wu, Z., Jiao, L., Li, K., & Zheng, W. (2024, September 1). Key Technologies in Developing Chip-Scale Hot Atomic Devices for Precision Quantum Metrology. Micromachines. Multidisciplinary Digital Publishing Institute (MDPI). https://doi.org/10.3390/mi15091095
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