Some aspects of quantitative analysis and correction of radiation damage

Abstract

Radiation damage is the major source of systematic error in macromolecular data collected at third-generation synchrotron beamlines. In this paper, a simple way of analysing data for radiation damage is proposed and shown to give results that are easy to interpret. Results of correction of radiation damage obtained with an exponential decay function as implemented in XSCALE (from the XDS package) are shown, and aspects of the mathematical treatment of radiation damage, as well as experimental requirements for the correction and utilization of radiation damage are discussed. Furthermore, a method for quantifying the coverage and evenness of sampling of rotation range is proposed. © 2006 International Union of Crystallography - all rights reserved.