A sagittally focusing double-multilayer monochromator for ultrafast X-ray imaging applications

18Citations
Citations of this article
6Readers
Mendeley users who have this article in their library.
Get full text

Abstract

The development of a sagittally focusing double-multilayer monochromator is reported, which produces a spatially extended wide-bandpass X-ray beam from an intense synchrotron bending-magnet source at the Advanced Photon Source, for ultrafast X-ray radiography and tomography applications. This monochromator consists of two W/B4C multilayers with a 25 A period coated on Si single-crystal substrates. The second multilayer is mounted on a sagittally focusing bender, which can dynamically change the bending radius of the multilayer in order to condense and focus the beam to various points along the beamline. With this new apparatus, it becomes possible to adjust the X-ray beam size to best match the area detector size and the object size to facilitate more efficient data collection using ultrafast X-ray radiography and tomography. © 2007 International Union of Crystallography Printed in Singapore - all rights reserved.

Cite

CITATION STYLE

APA

Wang, Y., Narayanan, S., Liu, J., Shu, D., Mashayekhi, A., Qian, J., & Wang, J. (2007). A sagittally focusing double-multilayer monochromator for ultrafast X-ray imaging applications. In Journal of Synchrotron Radiation (Vol. 14, pp. 138–143). https://doi.org/10.1107/S0909049506050205

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free