Abstract
The energy density crystallization threshold of amorphous GeSb films has been studied for the first time as a function of the laser pulse duration in the range from 170 fs to 8 ns. The results obtained provide evidence of the existence of enhanced crystallization upon irradiation with pulses shorter than 800 fs, which is most likely related to electronic excitation effects. © 1996 The American Physical Society.
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CITATION STYLE
Solis, J., Afonso, C. N., Hyde, S. C. W., Barry, N. P., & French, P. M. W. (1996). Existence of electronic excitation enhanced crystallization in gesb amorphous thin films upon ultrashort laser pulse irradiation. Physical Review Letters, 76(14), 2519–2522. https://doi.org/10.1103/PhysRevLett.76.2519
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