Sub-10 second fly-scan nano-tomography using machine learning

Abstract

X-ray computed tomography is a versatile technique for 3D structure characterization. However, conventional reconstruction algorithms require that the sample not change throughout the scan, and the timescale of sample dynamics must be longer than the data acquisition time to fulfill the stable sample requirement. Meanwhile, concerns about X-ray-induced parasite reaction and sample damage have driven research efforts to reduce beam dosage. Here, we report a machine-learning-based image processing method that can significantly reduce data acquisition time and X-ray dose, outperforming conventional approaches like Filtered-Back Projection, maximum-likelihood, and model-based maximum-a-posteriori probability. Applying machine learning, we achieve ultrafast nano-tomography with sub-10 second data acquisition time and sub-50 nm pixel resolution in a transmission X-ray microscope. We apply our algorithm to study dynamic morphology changes in a lithium-ion battery cathode under a heating rate of 50 oC min−1, revealing crack self-healing during thermal annealing. The proposed method can be applied to various tomography modalities.