Using X-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings

Abstract

Model paint materials were generated by adding a range of inorganic materials into an epoxy. The inorganic materials included inhibitors (Zn 3(PO 4) 2 and SrCrO 4) and a filler (rutile TiO 2).The SrCrO 4 system was characterized using SEM, TEM, PALS and Raman spectroscopy and found to have an even distribution of inhibitor in the polymer matrix. X-ray tomography was performed on the mixed SrCrO 4/TiO 2 and Zn 3(PO 4) 2/TiO 2 systems. A new technique called data constrained modelling was combined with the tomographic technique to produce a 3D distribution of the inorganic phases within the polymer matrix. © 2011 Elsevier B.V.