Extended energy range analysis for angle-resolved time-of-flight photoelectron spectroscopy

Abstract

An approximation method for electrostatic time-of-flight (ToF) spectroscopy on photoelectrons distributed over a wide energy range is presented. This method is an extension of conventional analysis and aims at specific energy and angular regions, where distinctly different emission angles and energies are mapped to the same ToF and detector position by the spectrometer. The general formulation and the systematic errors are presented, and a practical example is demonstrated for photoelectrons from Ag(001) with kinetic energies of 0.5-25 eV.