Abstract
In this paper, we present a new algorithm to co-optimize the core wrapper design and the SOC test scheduling. The SOC test scheduling problem is first formulated into a twodimension floorplan problem and a sequence pair architecture is used to represent it. Then we propose a two-stage GA (Genetic Algorithm) to solve the SOC test scheduling problem. Experiments on ITC'02 benchmark show that our algorithm can effectively reduce test time so as to decrease SOC test cost. © 2006 IOP Publishing Ltd.
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CITATION STYLE
Yu, Y., Peng, X. Y., & Peng, Y. (2006). A test scheduling algorithm based on two-stage GA. Journal of Physics: Conference Series, 48(1), 658–662. https://doi.org/10.1088/1742-6596/48/1/123
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