A novel method of improving transition delay fault coverage using multiple scan enable signals

N. Devtaprasanna; A. Gunda; P. Krishnamurthy; S. M. Reddy; I. Pomeranz

Conference Proceedings

A novel method of improving transition delay fault coverage using multiple scan enable signals

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors (2005) 2005 471-474

DOI: 10.1109/ICCD.2005.13

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Abstract

We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of which require the ability to switch at-speed between launch and capture cycles. © 2005 IEEE.

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Devtaprasanna, N., Gunda, A., Krishnamurthy, P., Reddy, S. M., & Pomeranz, I. (2005). A novel method of improving transition delay fault coverage using multiple scan enable signals. In Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors (Vol. 2005, pp. 471–474). https://doi.org/10.1109/ICCD.2005.13

A novel method of improving transition delay fault coverage using multiple scan enable signals

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